TITLE

Development of a spatially resolving x-ray crystal spectrometer for measurement of ion-temperature (Ti) and rotation-velocity (v) profiles in ITER

AUTHOR(S)
Hill, K. W.; Bitter, M.; Delgado-Aparicio, L.; Johnson, D.; Feder, R.; Beiersdorfer, P.; Dunn, J.; Morris, K.; Wang, E.; Reinke, M.; Podpaly, Y.; Rice, J. E.; Barnsley, R.; O'Mullane, M.; Lee, S. G.
PUB. DATE
October 2010
SOURCE
Review of Scientific Instruments;Oct2010, Vol. 81 Issue 10, p10E322
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Imaging x-ray crystal spectrometer (XCS) arrays are being developed as a US-ITER activity for Doppler measurement of Ti and v profiles of impurities (W, Kr, and Fe) with ∼7 cm (a/30) and 10-100 ms resolution in ITER. The imaging XCS, modeled after a prototype instrument on Alcator C-Mod, uses a spherically bent crystal and 2D x-ray detectors to achieve high spectral resolving power (E/dE>6000) horizontally and spatial imaging vertically. Two arrays will measure Ti and both poloidal and toroidal rotation velocity profiles. The measurement of many spatial chords permits tomographic inversion for the inference of local parameters. The instrument design, predictions of performance, and results from C-Mod are presented.
ACCESSION #
54858031

 

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