TITLE

2D soft x-ray system on DIII-D for imaging the magnetic topology in the pedestal region

AUTHOR(S)
Shafer, M. W.; Battaglia, D. J.; Unterberg, E. A.; Evans, T. E.; Hillis, D. L.; Maingi, R.
PUB. DATE
October 2010
SOURCE
Review of Scientific Instruments;Oct2010, Vol. 81 Issue 10, p10E534
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A new tangential two-dimensional soft x-ray imaging system (SXRIS) is being designed to examine the edge island structure in the lower X-point region of DIII-D. Plasma shielding and/or amplification of the calculated vacuum islands may play a role in the suppression of edge-localized modes via resonant magnetic perturbations (RMPs). The SXRIS is intended to improve the understanding of three-dimensional (3D) phenomena associated with RMPs. This system utilizes a tangential view with a pinhole imaging system and spectral filtering with beryllium foils. SXR emission is chosen to avoid line radiation and allows suitable signal at the top of a H-mode pedestal where Te∼1-2 keV. A synthetic diagnostic calculation based on 3D SXR emissivity estimates is used to help assess signal levels and resolution of the design. A signal-to-noise ratio of 10 at 1 cm resolution is expected for the perturbed signals, which are sufficient to resolve most of the predicted vacuum island sizes.
ACCESSION #
54857999

 

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