TITLE

2D electron cyclotron emission imaging at ASDEX Upgrade (invited)

AUTHOR(S)
Classen, I. G. J.; Boom, J. E.; Suttrop, W.; Schmid, E.; Tobias, B.; Domier, C. W.; Luhmann, N. C.; Donné, A. J. H.; Jaspers, R. J. E.; de Vries, P. C.; Park, H. K.; Munsat, T.; García-Muñoz, M.; Schneider, P. A.
PUB. DATE
October 2010
SOURCE
Review of Scientific Instruments;Oct2010, Vol. 81 Issue 10, p10D929
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The newly installed electron cyclotron emission imaging diagnostic on ASDEX Upgrade provides measurements of the 2D electron temperature dynamics with high spatial and temporal resolution. An overview of the technical and experimental properties of the system is presented. These properties are illustrated by the measurements of the edge localized mode and the reversed shear Alfvén eigenmode, showing both the advantage of having a two-dimensional (2D) measurement, as well as some of the limitations of electron cyclotron emission measurements. Furthermore, the application of singular value decomposition as a powerful tool for analyzing and filtering 2D data is presented.
ACCESSION #
54857967

 

Share

Read the Article

Courtesy of NEW JERSEY STATE LIBRARY

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics