Direct quantitative measurement of compositional enrichment and variations in In[sub y]Ga[sub 1-y]As quantum dots

Crozier, P. A.; Catalano, M.; Cingolani, R.; Passaseo, A.
November 2001
Applied Physics Letters;11/5/2001, Vol. 79 Issue 19, p3170
Academic Journal
Assessment of the composition of quantum dots on the nanoscale is crucial for a deeper understanding of both the growth mechanisms and the properties of these materials. In this letter, we discuss a direct method to obtain a quantitative evaluation of the In variation across nanometer-sized InGaAs quantum dots embedded in a GaAs matrix, by means of electron energy-loss spectroscopy in a scanning transmission electron microscope. © 2001 American Institute of Physics.


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