TITLE

Conducting probe atomic force microscopy applied to organic conducting blends

AUTHOR(S)
Plane`s, Je´ro⁁me; Houze´, Fre´de´ric; Chre´tien, Pascal; Schneegans, Olivier
PUB. DATE
October 2001
SOURCE
Applied Physics Letters;10/29/2001, Vol. 79 Issue 18, p2993
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Atomic force microscopy (AFM) is used in contact mode with a conducting tip to probe the conducting network of the conductive polymer polyaniline blended in an insulating polymer matrix. The high resistance contrast and sharp boundaries between conductive and insulating phases is observed down to scales in the 10 nm range. The very low scale electric dispersion corresponds to the morphologic phase segregation known from conventional AFM or transmission electron microscopy measurements, which is responsible for the ultralow electrical percolation threshold previously demonstrated in this system. © 2001 American Institute of Physics.
ACCESSION #
5402533

 

Related Articles

  • Gradient force: The mechanism for surface relief grating formation in azobenzene functionalized polymers. Kumar, Jayant; Li, Lian; Jiang, Xin Li; Kim, Dong-Yu; Lee, Taek Seung; Tripathy, Sukant // Applied Physics Letters;4/27/1998, Vol. 72 Issue 17 

    A model for the formation of holographic surface relief gratings in azobenzene functionalized polymers is presented. Forces leading to migration of polymer chains upon exposure to light in the absorption band of the azo chromophore are attributed to dipoles interacting with the gradient of the...

  • Atomic force microscopy phase imaging of conductive polymer blends with ultralow percolition... Planes, Jerome; Samson, Yves; Cheguettine, Yasmina // Applied Physics Letters;9/6/1999, Vol. 75 Issue 10, p1395 

    Describes the atomic force microscopy phase imaging of conductive polymer blends with ultralow percolation threshold. Resolution phase contrast imaging; Insight in the distribution of the conductive phase within the matrix provided by cross-section images.

  • Covalent bond force profile and cleavage in a single polymer chain. Garnier, Lionel; Gauthier-Manuel, Bernard; van der Vegte, Eric W.; Snijders, Jaap; Hadziioannou, Georges // Journal of Chemical Physics;8/8/2000, Vol. 113 Issue 6, p2497 

    We present here the measurement of the single-polymer entropic elasticity and the single covalent bond force profile, probed with two types of atomic force microscopes (AFM) on a synthetic polymer molecule: polymethacrylic acid in water. The conventional AFM allowed us to distinguish two types...

  • Thermomechanical writing with an atomic force microscope tip. Mamin, H.J.; Rugar, D. // Applied Physics Letters;8/24/1992, Vol. 61 Issue 8, p1003 

    Presents a technique for performing nanoindention of polymer surfaces. Use of atomic force microscope tip; Dependence of the size of the pits on the size of the laser pulse and on the loading force of the tip; Possibility of making even smaller marks.

  • Orientation control of poly(vinylidenefluoride-trifluoroethylene) crystals and molecules using atomic force microscopy. Kimura, Kuniko; Kobayashi, Kei; Yamada, Hirofumi; Horiuchi, Toshihisa; Ishida, Kenji; Matsushige, Kazumi // Applied Physics Letters;6/9/2003, Vol. 82 Issue 23, p4050 

    We have developed an aligning technique for polymer crystals and molecular chains utilizing contact-mode atomic force microscopy (AFM). We have aligned lamellar crystals and molecular chains of poly(vinylidenefluoride-trifluoroethylene) thin films. By scanning the film surface using an AFM...

  • Direct observation of polymer gel surfaces by atomic force microscopy. Suzuki, A.; Yamazaki, M.; Kobiki, Y. // Journal of Chemical Physics;1/22/1996, Vol. 104 Issue 4, p1751 

    We report here, for the first time, the direct observation of the submicron structure of gel surfaces in water by using an atomic force microscope (AFM). We present also its change in response to external stimuli; we investigated, among the variables that affect the topography of the gel...

  • Energy dissipation during nanoscale indentation of polymers with an atomic force microscope. Boschung, E.; Heuberger, M. // Applied Physics Letters;6/27/1994, Vol. 64 Issue 26, p3566 

    Analyzes the energy dissipation during nanoscale indentation of polymers with an atomic force microscope. Application of the nanoscale indentation in electronic or micromechanical devices; Nanomechanical properties of polymer; Mechanism of indentation.

  • Structural evolution of crystalline polymer latex films: Propagating and confined acoustic modes. Pierno, Matteo; Casari, Carlo S.; Piazza, Roberto; Bottani, Carlo E. // Applied Physics Letters;3/10/2003, Vol. 82 Issue 10, p1532 

    Structural evolution of polytetrafluoroethylene latex polymer films has been studied by Brillouin light scattering and atomic force microscopy (AFM). Using a tunable sintering process, we have controlled the degree of particle connectivity yielding a crossover in the behavior of acoustic...

  • Interfacial adhesion of polymeric adhesive film on different surfaces in the fabrication of polymer photonic devices. Uddin, M.; Ho, W.; Chan, Hau // Journal of Materials Science: Materials in Electronics;Jun2007, Vol. 18 Issue 6, p655 

    One main critical issue in the fabrication of polymer optical devices is the adhesion strength of polymeric layer to the substrate. High adhesion strength is desirable and critical in order to avoid peeling out of polymeric layer from the substrate due to stress generated during fabrication,...

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics