TITLE

Products

PUB. DATE
October 2001
SOURCE
Spectroscopy;Oct2001, Vol. 16 Issue 10, p50
SOURCE TYPE
Trade Publication
DOC. TYPE
Article
ABSTRACT
Evaluates several spectroscopic devices. CoatMaster 450 XRF coating thickness measurement system from Edax; AutoPellet press used in sample preparation for x-ray spectroscopy from Carver; Infrared Variable Angle Spectroscopic Ellipsometer for thin film characterization from J.A. Woollam.
ACCESSION #
5357198

 

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