Polarization mode preservation in elliptical index tailored optical fibers for apertureless scanning near-field optical microscopy

Zeh, Christoph; Spittel, Ron; Unger, Sonja; Opitz, Jörg; Köhler, Bernd; Kirchhof, Johannes; Bartelt, Hartmut; Eng, Lukas M.
September 2010
Applied Physics Letters;9/6/2010, Vol. 97 Issue 10, p103108
Academic Journal
We report on the development of elliptical, index tailored optical fibers for higher-order mode preservation for fiber-based, apertureless, internally illuminated scanning near-field optical microscopy (ai-SNOM). The fiber structure is simulated by the finite element method, showing large spreads of the effective indices for neighboring first higher-order modes. We demonstrate experimentally that due to this spread, the first higher-order modes do not couple, hence, the polarization is maintained, when the fiber is bent down to 1 cm radius. Further, we discuss the implications for ai-SNOM applications.


Related Articles

  • Effect of depolarization of scattered evanescent waves on particle-trapped near-field scanning... Min Gu; Pu Chun Ke // Applied Physics Letters;7/12/1999, Vol. 75 Issue 2, p175 

    Reports that the degree of polarization of the scattered evanescent wave is measured with a laser-trapped particle for different incident angles. Improvement in the contrast of the evanescent wave interference pattern imaged in a particle-trapped near-field scanning optical microscope.

  • Field characterization of a D-shaped optical fiber using scanning near-field optical microscopy. Huntington, S.T.; Nugent, K.A. // Journal of Applied Physics;7/15/1997, Vol. 82 Issue 2, p510 

    Reports that scanning near-field optical microscopy is used to measure the mode profile and evanescent field of a Ge-doped D-shaped optical fiber. Structure of the fiber as determined by differential etching and investigation of the resultant topography with an atomic force microscope;...

  • Infrared-lit needle senses crystal vibrations. Brinkmann, Uwe // Laser Focus World;Nov2002, Vol. 38 Issue 11, p32 

    Focuses on the construction of an optical image of a surface by near-field scanning optical microscope (NSOM). Guidance of light via a fiber tip; Development of an infrared NSOM based on an antenna-type tip that senses chemical compositions; Use of the instrument to obtain resonance with...

  • Toward a near-field optical array. Pantano, Paul; Walt, David R. // Review of Scientific Instruments;Mar97, Vol. 68 Issue 3, p1357 

    Presents the fabrication and characterization of three near-field optical array types. Chemical etching of a coherent fiber-optic bundle to produce an array of nanometer-sized, optical fiber tips; Variable nanoarchitectures that should be amenable to a large number of near-field scanning...

  • Increasing shear force microscopy scanning rate using active quality-factor control. Antognozzi, M.; Szczelkun, M. D.; Humphris, A. D. L.; Miles, M. J. // Applied Physics Letters;4/28/2003, Vol. 82 Issue 17, p2761 

    The use of an active quality-factor control device has been demonstrated to increase the scanning rate of a shear force microscope by lowering the quality factor of the oscillating probe. Shear force microscopy )often used in combination with scanning near-field optical microscopy) requires slow...

  • Scanning near-field optical microscopy with aperture probes: Fundamentals and applications. Hecht, Bert; Sick, Beate; Wild, Urs P.; Deckert, Volker; Zenobi, Renato; Martin, Olivier J. F.; Martin, Olivier J.F.; Pohl, Dieter W. // Journal of Chemical Physics;5/8/2000, Vol. 112 Issue 18 

    In this review we describe fundamentals of scanning near-field optical microscopy with aperture probes. After the discussion of instrumentation and probe fabrication, aspects of light propagation in metal-coated, tapered optical fibers are considered. This includes transmission properties and...

  • Video rate near-field scanning optical microscopy. Bukofsky, S.J.; Grober, R.D. // Applied Physics Letters;11/10/1997, Vol. 71 Issue 19, p2749 

    Examines the use of optical fiber probes for increasing the speed of near-field scanning optical microscopes (NSOM). Role of the system bandwidth increase in providing sub-diffraction limit imaging of samples; Use of NSOM as a viable tool for video rate imaging; Relevance of the optical signal...

  • Measurement of an elliptical fiber mode field using near-field microscopy. Butler, D. J.; Horsfall, A.; Nugent, K. A.; Roberts, A.; Bassett, I. M.; Lo, K. M. // Journal of Applied Physics;6/1/1995, Vol. 77 Issue 11, p5514 

    Presents a study which determined the field structure within a non circularly symmetric optical fiber using near-field scanning optical microscopy. Application of the polarization maintaining fibers for photonics systems; Model used for the optical fiber; Overview of the measured field...

  • Characterization of optical fibers using near-field scanning optical microscopy. Butler, D. J.; Nugent, K. A.; Roberts, A. // Journal of Applied Physics;3/15/1994, Vol. 75 Issue 6, p2753 

    Provides information on a study which described a method of determining the field distribution within an optical fiber of arbitrary refractive index profile using near-field scanning optical microscopy. Properties of optical fibers; Experiment; Results and discussion; Conclusion.


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics