High-resolution friction force microscopy under electrochemical control

Labuda, Aleksander; Paul, William; Pietrobon, Brendan; Lennox, R. Bruce; Grütter, Peter H.; Bennewitz, Roland
August 2010
Review of Scientific Instruments;Aug2010, Vol. 81 Issue 8, p083701
Academic Journal
We report the design and development of a friction force microscope for high-resolution studies in electrochemical environments. The design choices are motivated by the experimental requirements of atomic-scale friction measurements in liquids. The noise of the system is analyzed based on a methodology for the quantification of all the noise sources. The quantitative contribution of each noise source is analyzed in a series of lateral force measurements. Normal force detection is demonstrated in a study of the solvation potential in a confined liquid, octamethylcyclotetrasiloxane. The limitations of the timing resolution of the instrument are discussed in the context of an atomic stick-slip measurement. The instrument is capable of studying the atomic friction contrast between a bare Au(111) surface and a copper monolayer deposited at underpotential conditions in perchloric acid.


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