TITLE

Note: Multiscale scanning probe microscopy

AUTHOR(S)
Chassagne, L.; Blaize, S.; Ruaux, P.; Topçu, S.; Royer, P.; Alayli, Y.; Lérondel, G.
PUB. DATE
August 2010
SOURCE
Review of Scientific Instruments;Aug2010, Vol. 81 Issue 8, p086101
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Combining the nanoscopic and macroscopic worlds is a serious challenge common to numerous scientific fields, from physics to biology. In this paper, we demonstrate nanometric resolution over a millimeter range by means of atomic-force microscopy using metrological stage. Nanometric repeatability and millimeter range open up the possibility of probing components and materials combining multiscale properties i.e., engineered nanomaterials. Multiscale probing is not limited to atomic-force microscopy and can be extended to any type of scanning probe technique in nanotechnology, including piezoforce microscopy, electrostatic-force microscopy, and scanning near-field optical microscopy.
ACCESSION #
53422018

 

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