TITLE

Core level photoionization on free sub-10-nm nanoparticles using synchrotron radiation

AUTHOR(S)
Meinen, Jan; Khasminskaya, Svetlana; Eritt, Markus; Leisner, Thomas; Antonsson, Egill; Langer, Burkhard; Rühl, Eckart
PUB. DATE
August 2010
SOURCE
Review of Scientific Instruments;Aug2010, Vol. 81 Issue 8, p085107
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A novel instrument is presented, which permits studies on singly charged free nanoparticles in the diameter range from 1 to 30 nm using synchrotron radiation in the soft x-ray regime. It consists of a high pressure nanoparticle source, a high efficiency nanoparticle beam inlet, and an electron time-of-flight spectrometer suitable for probing surface and bulk properties of free, levitated nanoparticles. We show results from x-ray photoelectron spectroscopy study near the Si L3,2-edge on 8.2 nm SiO2 particles prepared in a nanoparticle beam. The possible use of this apparatus regarding chemical reactions on the surface of nanometer-sized particles is highlighted. This approach has the potential to be exploited for process studies on heterogeneous atmospheric chemistry.
ACCESSION #
53422007

 

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