TITLE

Precise total electron yield measurements for impact of singly or multiply charged ions on clean solid surfaces

AUTHOR(S)
Eder, H.; Vana, M.; Aumayr, F.; Winter, H.P.
PUB. DATE
January 1997
SOURCE
Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p165
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Describes precise measurements of total electron yields for ion-induced electron emission from a clean polycrystalline gold surface under perpendicular impact of singly and multiply charged ions at impact energies from practically 0 up to 40 keV times primary ion charge. Determination of absolute total electron yield; Impact velocity.
ACCESSION #
5327626

 

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