Precise total electron yield measurements for impact of singly or multiply charged ions on clean solid surfaces

Eder, H.; Vana, M.; Aumayr, F.; Winter, H.P.
January 1997
Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p165
Academic Journal
Describes precise measurements of total electron yields for ion-induced electron emission from a clean polycrystalline gold surface under perpendicular impact of singly and multiply charged ions at impact energies from practically 0 up to 40 keV times primary ion charge. Determination of absolute total electron yield; Impact velocity.


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