Approach interactions of scanned probes in dynamic pecking mode

Wetsel, G. C.; Farahi, R. H.; Richardson, C. J. K.; Spicer, J. B.
October 2001
Applied Physics Letters;10/15/2001, Vol. 79 Issue 16, p2657
Academic Journal
Sharp, conical, metallic tips oriented perpendicular to the axis of a rod vibrating in bending (pecking mode) are used as force sensors in scanned force probes and as optical scatterers in apertureless near-field optical microscopes. We have measured the displacement of such probes as a function of frequency and tip-sample separation during approach of the probe tip to a solid-sample surface. We have also developed a nonlinear model describing the attenuation of the probe motion during approach that takes into account the variation of the force on the probe during each cycle of vibrational motion. The experimental data and the theory are in good agreement. The results enable proper design of tip-sample-distance control systems, inference of material parameters, and an improved understanding of apertureless-near-field-optical-microscope measurements. © 2001 American Institute of Physics.


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