Tapping mode capacitance microscopy

Goto, Kazuya; Hane, Kazuhiro
January 1997
Review of Scientific Instruments;Jan1997, Vol. 68 Issue 1, p120
Academic Journal
Presents a technique for microscopic capacitance measurements. Principle; Description of a scanning force microscope that was modified for the tapping mode capacitance measurement; Tip-sample capacitance signal.


Related Articles

  • Contrast reversal in scanning capacitance microscopy imaging. Stephenson, Robert; Verhulst, Anne; De Wolf, Peter; Caymax, Matty; Vandervorst, Wilfried // Applied Physics Letters;11/2/1998, Vol. 73 Issue 18 

    We have investigated the quantification properties of scanning capacitance microscopy (SCM) by using two dedicated test structures and highlight the response of SCM to changes in dopant density. Our results indicate that contrast reversal occurs and that the SCM output is not always a...

  • Determination of nematic polar anchoring from retardation versus voltage measurements. Nastishin, Yu.A.; Polak, R.D. // Applied Physics Letters;7/12/1999, Vol. 75 Issue 2, p202 

    Studies the determination of nematic polar anchoring from retardation versus voltage measurements. Development of a generalized model designed to eliminate the capacitance measurement.

  • Specific methodology for capacitance imaging by atomic force microscopy: A breakthrough towards an elimination of parasitic effects. Chrétien, Pascal; Estevez, Ivan; Schneegans, Olivier; Houzé, Frédéric // Applied Physics Letters;2/24/2014, Vol. 104 Issue 8, p1 

    On the basis of a home-made nanoscale impedance measurement device associated with a commercial atomic force microscope, a specific operating process is proposed in order to improve absolute (in sense of "nonrelative") capacitance imaging by drastically reducing the parasitic effects due to...

  • Prickly Nickel Nanowires Grown on Cu-Ni Substrate Surface as High Performance Cathodes for Hydrogen Evolution Reaction. Shervedani, Reza Karimi; Amini, Akbar; Karevan, Motahareh // Journal of New Materials for Electrochemical Systems;2015, Vol. 18 Issue 2, p95 

    A new and highly rough nickel electrode is fabricated based on in-situ assembling of prickly nickel nanowires, synthesized by electroless deposition method on a layer of nickel freshly preelectrodeposited on copper, constructing Cu-Ni-PNNWs. Then, the fabricated electrode is studied for Hydrogen...

  • Useful and low cost instrument for capacitance measurements. Karadeniz, Serdar; Serin, Necmi // Review of Scientific Instruments;Aug2000, Vol. 71 Issue 8 

    In this study we aimed to develop a practical, useful, and low cost instrument for measuring the capacitance of metal/semiconductor/metal structures. The device operates in the continuous frequency range of 2 Hz-20 kHz. The unknown capacitances were measured by both our instrument and a...

  • Testing Capacitors in-Circuit.  // Poptronics;Jun2000, Vol. 1 Issue 6, p59 

    Answers a query on how to test small-value surface-mount capacitors in-circuit. Ways to measure capacitance; Howard Electronic Instruments' `Capacitor Wizard' for in-circuit testing of the effective series resistance of capacitors, not the capacitance.

  • Raman investigation of the ageing of Ni-BaTiO3 multilayer ceramic capacitors. Umeri, Andrea; Kuku, Titilayo; Scuor, Nicola; Sergo, Valter // Journal of Materials Science;Feb2008, Vol. 43 Issue 3, p922 

    Ni-BaTiO3 multilayer ceramic capacitors (MLCC) have been aged at 121 °C and 100% Relative Humidity for 2,600 h. Raman and energy dispersive spectral measurements have been made on both aged and unaged samples. Raman spectra indicate the presence of a coating of substoichiometric SnO x (1 < x...

  • Capacitance-to-Digital Converter Facilitates Level Sensing in Diagnostic Systems. Scarlett, Jim // Analog Dialogue;Apr2014, Vol. 48, p1 

    The article focuses on the use of a capacitance-to-digital converter (CDC) to perform function with a high level of confidence. It states that the capacitance value varies with plate area, distance between the plates, and dielectric constant and also mentions that one can measure the changing...

  • Approach to nonphotoperturbed differential capacitance measurements: A front-wing cantilever. Chang, M. N.; Chen, C. Y.; Huang, W. J.; Cheng, T. C. // Applied Physics Letters;7/11/2005, Vol. 87 Issue 2, p023102 

    We have developed a front-wing (FW) cantilever structure that can significantly suppress photoperturbation effects during scanning capacitance microscopy (SCM) and scanning capacitance spectroscopy (SCS) measurements. The FW cantilever provides an effective shadow area that fully covers the scan...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics