Multicomponent wavefield characterization with a novel scanning laser interferometer

Blum, Thomas E.; van Wijk, Kasper; Pouet, Bruno; Wartelle, Alexis
July 2010
Review of Scientific Instruments;Jul2010, Vol. 81 Issue 7, p073101
Academic Journal
The in-plane component of the wavefield provides valuable information about media properties from seismology to nondestructive testing. A new compact scanning laser ultrasonic interferometer collects light scattered away from the angle of incidence to provide the absolute ultrasonic displacement for both the out-of-plane and an in-plane components. This new system is tested by measuring the radial and vertical polarization of a Rayleigh wave in an aluminum half-space. The estimated amplitude ratio of the horizontal and vertical displacement agrees well with the theoretical value. The phase difference exhibits a small bias between the two components due to a slightly different frequency response between the two processing channels of the prototype electronic circuitry.


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