A simple hard x-ray “nanoslit” for measuring wavefront intensity

Takano, Hidekazu; Hashimoto, Takuto; Tsuji, Takuya; Koyama, Takahisa; Tsusaka, Yoshiyuki; Kagoshima, Yasushi
July 2010
Review of Scientific Instruments;Jul2010, Vol. 81 Issue 7, p073702
Academic Journal
A new method is proposed for nanoscale hard x-ray measurements. This method uses a reflection on a heavy-metal wire that functions as a single slit with a nanoscale aperture for a parallel x-ray beam. This “nanoslit” can be used to perform high-spatial-resolution measurements of the intensity distribution of a wavefront that diverges from an aperture. In experiments, Fresnel fringes generated by a rectangular aperture were measured using a 300-μm-diameter platinum wire as the nanoslit. In these experiments, the finest fringes with a period of 26 nm could be successfully resolved.


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