TITLE

Factors controlling the a-axis orientation of strontium bismuth tantalate thin films fabricated by chemical solution deposition

AUTHOR(S)
Iijima, Ryuta
PUB. DATE
October 2001
SOURCE
Applied Physics Letters;10/1/2001, Vol. 79 Issue 14, p2240
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The a-axis orientation of strontium bismuth tantalate (SBT) thin films on Pt/TiO[sub x]/SiO[sub 2]/Si substrates was found to be controlled by the atomic composition of the precursor solution, heating rate for thermal annealing, and thickness of the single-annealed layer of chemical solution deposition. Under optimized conditions, an increase in the thickness of the total film caused the orientation to change from random to a-axis preferred. It was considered that anisotropic growth is available for preparing a-axis preferentially oriented films. The SBT thin film, whose relative intensity of the (200) peak [I(200)/I(115)] was 2.3, had a remanent polarization (2P[sub r]) value of 30.4 μC/cm2. © 2001 American Institute of Physics.
ACCESSION #
5227937

 

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