TITLE

Electro-optic measurement of carrier mobility in an organic thin-film transistor

AUTHOR(S)
Bittle, E. G.; Brill, J. W.; Anthony, J. E.
PUB. DATE
July 2010
SOURCE
Applied Physics Letters;7/5/2010, Vol. 97 Issue 1, p013302
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We have used an electro-optic technique to measure the position-dependent infrared absorption of holes injected into a thin crystal of the organic semiconductor, 6,13-bis(triisopropylsilylethynyl)-pentacene incorporated in a field-effect transistor. By applying square-wave voltages of variable frequency to the gate or drain, one can measure the time it takes for charges to accumulate on the surface, and therefore, determine their mobility.
ACCESSION #
52060180

 

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