TITLE

Influence of edges on the exchange bias properties of ferromagnetic/antiferromagnetic nanodots

AUTHOR(S)
Baltz, V.; Gaudin, G.; Somani, P.; Dieny, B.
PUB. DATE
June 2010
SOURCE
Applied Physics Letters;6/28/2010, Vol. 96 Issue 26, p262505
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
For ferromagnetic (F)/antiferromagnetic (AF) nanodots contributions of AF spins to exchange bias is discussed. The relative weights of AF entities located at the dot edges, at the F/AF interface and in the AF grains were obtained by comparing the blocking temperature distribution of an array of nanodots with that of corresponding continuous film. Due to grain cutting, the grain size distribution is altered. We show here that the dot edges constitute additional locations for the formation of spin-glasslike AF regions at the F/AF interface. The result of patterning is thus twofold and weakens the dot ability to resist thermally activated magnetization reversal.
ACCESSION #
51975740

 

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