TITLE

Simultaneous force and current mapping of the Si(111)-(7×7) surface by dynamic force microscopy

AUTHOR(S)
Sugimoto, Yoshiaki; Yi, Insook; Morita, Ken-ichi; Abe, Masayuki; Morita, Seizo
PUB. DATE
June 2010
SOURCE
Applied Physics Letters;6/28/2010, Vol. 96 Issue 26, p263114
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We simultaneously obtain spatial maps of the interaction force and current between conductive tips and the Si(111)-(7×7) surface. The difference in the topographic profiles between atomic force microscopy and scanning tunneling microscopy is clearly visualized. We observe a current drop in the region where the chemical bonding force between the tip and surface atoms becomes significant. The peak values of the conductance above adatom sites are in good agreement with the value previously obtained by the theoretical simulation.
ACCESSION #
51975665

 

Related Articles

  • Morphology and electronic states of chemically treated CdZnTe surfaces. Egan, C. K.; Choubey, A.; Brinkman, A. W. // Journal of Applied Physics;Aug2010, Vol. 108 Issue 2, p024310 

    The morphology and electronic structure of chemically treated CdZnTe surfaces has been studied using atomic force microscopy and scanning tunneling microscopy/spectroscopy. Studies have been performed on wet chemically etched and passivated surfaces. Etching in bromine methanol solutions...

  • Atomic point-contact imaging. Smith, D. P. E.; Binnig, G.; Quate, C. F. // Applied Physics Letters;11/3/1986, Vol. 49 Issue 18, p1166 

    In tunneling microscopy a potential barrier separates a pointed tip from the sample to be investigated. In this letter we show that atomic resolution can be achieved in special cases where the gap spacing has been reduced to the point where the potential barrier may have completely collapsed. In...

  • An integrated scanning tunneling, atomic force and lateral force microscope. Wenzler, L. A.; Han, T.; Bryner, R. S.; Beebe, T. P. // Review of Scientific Instruments;Jan1994, Vol. 65 Issue 1, p85 

    We describe the design and operation of a combined scanning tunneling–atomic force–lateral force microscope [(STM), (AFM), (LFM)]. Including these capabilities in a single instrument reduces construction costs and increases flexibility. AFM and LFM may be performed simultaneously;...

  • A novel AFM/STM/SEM system. Ermakov, A. V.; Garfunkel, E. L. // Review of Scientific Instruments;Sep94, Vol. 65 Issue 9, p2853 

    An atomic force/scanning tunneling (AFM/STM) microscope intended for operation inside a scanning electron microscope (SEM) is described. This AFM/STM/SEM system enables us to image a sample conventionally by SEM as well as to investigate the local surface topography by AFM or STM. This device...

  • 1 nm deep mechanical processing of muscovite mica by atomic force microscopy. Miyake, Shojiro // Applied Physics Letters;11/13/1995, Vol. 67 Issue 20, p2925 

    Examines the atomic-scale mechanical processing of muscovite mica using an atomic force microscope. Use of scanning tunneling microscopy; Importance of atomic force microscope in the micromechanical processing; Impact of non-observance of surface atoms on mechanical processing on the atomic scale.

  • Limits of imaging resolution for atomic force microscopy of molecules. Weihs, T.P.; Nawaz, Z.; Jarvis, S.P.; Pethica, J.B. // Applied Physics Letters;12/30/1991, Vol. 59 Issue 27, p3536 

    Examines the use of imaging resolution for the atomic force microscopy of molecules. Use of the nanoindenter in elastic modulus and LB film measurement; Method in determining the imaging resolution; Comparison between the atomic force microscope and scanning tunneling microscopic.

  • Characterization of scanning tunneling microscopy and atomic force microscopy-based techniques... Fontaine, P.A.; Dubois, E.; Stievenard, D. // Journal of Applied Physics;8/15/1998, Vol. 84 Issue 4, p1776 

    Compares the nanolithography techniques of scanning tunneling microscope (STM) and atomic force microscope (AFM) which were based on local oxidation of silicon. Importance of lithography; How the nanolithography is performed; Advantages which AFM have over the STM; Conclusion drawn from the...

  • Air operating atomic force-scanning tunneling microscope suitable to study semiconductors... Cricenti, Antonio; Generosi, Renato // Review of Scientific Instruments;Apr95, Vol. 66 Issue 4, p2843 

    Describes a scanning tunneling atomic force microscope operating at ambient pressure. Instrument description; Imaging of a holographic platinum grating; Imaging of uncoated neurons growth on a gold-covered stainless steel substrate.

  • Scanning tunneling nanolithography of amorphous GeSb[sub 2]Te[sub 4] films. Sugawara, Kentaro; Gotoh, Tamihiro; Tanaka, Keiji // Applied Physics Letters;9/3/2001, Vol. 79 Issue 10 

    Nanoscale surface modifications have been induced using a scanning tunneling microscope in a chalcogenide film GeSb[sub 2]Te[sub 4], which is employed for optical phase change memories. Depressions and expansions appear when the surface is scanned with positive and negative tip voltages under...

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics