Room-temperature-grown rare-earth-doped GaN luminescent thin films

Lee, D. S.; Steckl, A. J.
September 2001
Applied Physics Letters;9/24/2001, Vol. 79 Issue 13
Academic Journal
Visible emission has been observed from rare-earth (RE)-doped GaN electroluminescent devices (ELDs) as-grown near room temperature on Si (50–100 °C): red from GaN:Eu, green from GaN:Er, and blue from GaN:Tm. Green emission at 537/558 nm from GaN:Er ELD had a measured brightness of ∼230 cd/m2 at 46 V bias. X-ray diffraction indicates that the low-temperature-grown GaN:Er structure was oriented with the c axis perpendicular to the substrate. Scanning electron and atomic force microscopy indicate that the films had a rough surface and a compact structure consisting of small grains. Electroluminescence intensity of GaN:RE was significantly improved with postgrowth annealing. For GaN:Er films, after 800 °C annealing, the green emission brightness efficiency increased by ∼10×. © 2001 American Institute of Physics.


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