X-ray phase retrieval in high-resolution refraction data from amorphous materials

Siu, K.; Nikulin, A. Y.; Tamasaku, K.; Ishikawa, T.
September 2001
Applied Physics Letters;9/24/2001, Vol. 79 Issue 13
Academic Journal
A recently developed experimental–analytical x-ray diffraction method for the direct, nondestructive characterization of crystalline materials is applied to analyze high-resolution x-ray refraction data from amorphous materials. The method uses a logarithmic dispersion relation to determine the x-ray phase. A priori knowledge of the sample structure is utilized to reconstruct the physical characteristics of the sample with a resolution of 0.25 μm. © 2001 American Institute of Physics.


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