TITLE

Diameter dependence of the minority carrier diffusion length in individual ZnO nanowires

AUTHOR(S)
Soudi, A.; Dhakal, P.; Gu, Y.
PUB. DATE
June 2010
SOURCE
Applied Physics Letters;6/21/2010, Vol. 96 Issue 25, p253115
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The minority carrier diffusion length, LD, was directly measured in individual ZnO nanowires by a near-field scanning photocurrent microscopy technique. The diameter dependence of LD suggests a diameter-dependent surface electronic structure, particularly an increase in the density of mid-band-gap surface states with the decreasing diameter. This diameter dependence of the surface electronic structure might be a universal phenomenon in wurtzite-type nanostructures, and is critical in interpreting and understanding the effects of surfaces on various material properties.
ACCESSION #
51709483

 

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