Temperature dependence of optical anisotropy of birefringent porous silicon

Nishida, Kohei; Fujii, Minoru; Hayashi, Shinji; Diener, Joachim
June 2010
Applied Physics Letters;6/14/2010, Vol. 96 Issue 24, p243102
Academic Journal
Temperature dependence of the in-plane optical anisotropy of birefringent porous Si produced from a (110) Si wafer is studied. The anisotropy of refractive indices in the [001] and [formula] directions increased about 0.3% when the temperature rose from 30 to 100 °C. The effective medium approximation could reproduce the experimental result in the low temperature range, while discrepancy appeared at high temperatures. The discrepancy suggests that the structural anisotropy of porous Si starts to relax at relatively low temperatures.


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