Squeezing out hidden force information from scanning force microscopes

Todd, Brian A.; Eppell, Steven J.; Zypman, Fredy R.
September 2001
Applied Physics Letters;9/17/2001, Vol. 79 Issue 12, p1888
Academic Journal
A method to measure force-separation curves with a scanning force microscope is presented. Forces within the “snap to contact” are obtained by high-speed (MHz) measurement of cantilever deflection signals analyzed using the generalized beam theory. Numerical simulation is used to demonstrate the effectiveness of the method. Experimental results show that the method yields complete continuous force-separation curves with flimsy cantilevers in fluids allowing for sensitive force measurements in nonvacuum environments. © 2001 American Institute of Physics.


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