TITLE

Microstructure of epitaxial strained BiCrO3 thin films

AUTHOR(S)
David, A.; Boullay, Ph.; Mangalam, R. V. K.; Barrier, N.; Prellier, W.
PUB. DATE
May 2010
SOURCE
Applied Physics Letters;5/31/2010, Vol. 96 Issue 22, p221904
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The structure and microstructure of fully strained BiCrO3 thin films have been investigated by x-rays diffraction and transmission electron diffraction, at room temperature. Interestingly, three structural variants are simultaneously stabilized within the film. While two of them are consistent with the existing phases in the bulk-below and above the 420 K structural transition, a different phase is identified. The existence of various structures has been attributed to the inhomogeneous distribution of local strains and oxygens resulting from a minimization of the strain-energy at the interface. These findings will open the route to a better understanding of Bi-based perovskites and metastable phases.
ACCESSION #
51227044

 

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