TITLE

Spectroscopic ellipsometry study of SrBi[sub 2]Ta[sub 2]O[sub 9] ferroelectric thin films

AUTHOR(S)
Bahng, Jae Ho; Lee, Mierie; Park, H. L.; Kim, Ill Won; Jeong, Jung Hyun; Kim, Kwang Joo
PUB. DATE
September 2001
SOURCE
Applied Physics Letters;9/10/2001, Vol. 79 Issue 11
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Optical properties of SrBi[sub 2]Ta[sub 2]O[sub 9] (SBT) ferroelectric thin films were investigated by spectroscopic ellipsometry at room temperature in the 1.5–5.5 eV spectral range. The films were grown on platinized silicon (Pt/Ti/SiO[sub 2]/Si) with a Bi/Sr ratio (x) range from 1.2 to 2.8 by pulsed-laser deposition. The measured pseudodielectric functions of the samples indicate the band-gap energy of SBT shifts to lower energies as x increases. The optical constants and band-gap energies of the SBT films were determined through multilayer analyses on their pseudodielectric functions. The band-gap energy of SBT is found to shift to lower energies quite linearly with x. The band-gap energy at stoichiometric composition (x=2) is estimated to be 4.1 eV. © 2001 American Institute of Physics.
ACCESSION #
5113206

 

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