Single-photon atomic force microscopy

Jun, Zhang
June 2010
Analytical & Bioanalytical Chemistry;Jun2010, Vol. 397 Issue 3, p987
Academic Journal
In the last few years, an array of novel technologies, especially the big family of scanning probe microscopy, now often integrated with other powerful imaging tools such as laser confocal microscopy and total internal reflection fluorescence microscopy, have been widely applied in the investigation of biomolecular interactions and dynamics. But it is still a great challenge to directly monitor the dynamics of biomolecular interactions with high spatial and temporal resolution in living cells. An innovative method termed “single-photon atomic force microscopy” (SP-AFM), superior to existing techniques in tracing biomolecular interactions and dynamics in vivo, was proposed on the basis of the combination of atomic force microscopy with the technologies of carbon nanotubes and single-photon detection. As a unique tool, SP-AFM, capable of simultaneous topography imaging and molecular identification at the subnanometer level by synchronous acquisitions and analyses of the surface topography and fluorescent optical signals while scanning the sample, could play a very important role in exploring biomolecular interactions and dynamics in living cells or in a complicated biomolecular background. [Figure not available: see fulltext.]


Related Articles

  • Optically monitoring the mechanical assembly of single molecules. Kufer, Stefan K.; Strackharn, Mathias; Stahl, Stefan W.; Gumpp, Hermann; Puchner, Elias M.; Gaub, Hermann E. // Nature Nanotechnology;Jan2009, Vol. 4 Issue 1, p45 

    Bottom-up assembly at the level of individual molecules requires a combination of utmost spatial precision and efficient monitoring. We have previously shown how to ‘cut-and-paste’ single molecules, and other groups have demonstrated that it is possible to beat the diffraction limit...

  • High-speed atomic force microscope combined with single-molecule fluorescence microscope. Fukuda, Shingo; Uchihashi, Takayuki; Iino, Ryota; Okazaki, Yasutaka; Yoshida, Masato; Igarashi, Kiyohiko; Ando, Toshio // Review of Scientific Instruments;Jul2013, Vol. 84 Issue 7, p073706 

    High-speed atomic force microscopy (HS-AFM) and total internal reflection fluorescence microscopy (TIRFM) have mutually complementary capabilities. Here, we report techniques to combine these microscopy systems so that both microscopy capabilities can be simultaneously used in the full extent....

  • Structure and Permeability of Ion-channels by Integrated AFM and Waveguide TIRF Microscopy. Ramachandran, Srinivasan; Arce, Fernando Teran; Patel, Nirav R.; Quist, Arjan P.; Cohen, Daniel A.; Lal, Ratnesh // Scientific Reports;3/21/2014, p1 

    Membrane ion channels regulate key cellular functions and their activity is dependent on their 3D structure. Atomic force microscopy (AFM) images 3D structure of membrane channels placed on a solid substrate. Solid substrate prevents molecular transport through ion channels thus hindering any...

  • Electrical conduction of carbon nanotube atomic force microscopy tips: Applications in nanofabrication. Austin, Alexander J.; Nguyen, Cattien V.; Quoc Ngo // Journal of Applied Physics;6/1/2006, Vol. 99 Issue 11, p114304 

    This paper reports the electrical transport properties of the interface of a multiwalled carbon nanotube (MWNT) in physical end contact with a hydrogen-passivated Si surface and a Pt surface. The electrical measurement was performed in an atomic force microscope (AFM) with a MWNT attached to a...

  • Nanotubes: A step in synthesis. Dresselhaus, Mildred S. // Nature Materials;Oct2004, Vol. 3 Issue 10, p665 

    Provides information about the synthesis of uniform, single-walled carbon nanotubes with no apparent length limit. Development of ultra-strong lightweight yarns for space applications; Use of atomic force microscopy; Conditions necessary for achieving ultra-long nanotube growth.

  • Effect of synthesis and acid purification methods on the microwave dielectric properties of single-walled carbon nanotube aqueous dispersions. Xie, Shawn X.; Gao, Fuqiang; Patel, Sunny C.; Booske, John H.; Hagness, Susan C.; Sitharaman, Balaji // Applied Physics Letters;9/23/2013, Vol. 103 Issue 13, p133114 

    We characterized the microwave-frequency (0.5-6 GHz) dielectric properties of aqueous dispersions of pristine and purified single-walled carbon nanotubes (SWCNTs). SWCNTs were synthesized by two CVD-based methods and purified using two acid-based purification methods. We characterized the...

  • Piezoresistive properties of carbon nanotubes under radial force investigated by atomic force microscopy. Nishio, Taichi; Miyato, Yuji; Kobayashi, Kei; Matsushige, Kazumi; Yamada, Hirofumi // Applied Physics Letters;2/11/2008, Vol. 92 Issue 6, p063117 

    We investigated the piezoresistive properties of single-wall carbon nanotubes (SWCNTs) under the tip-induced force in the radial direction using atomic force microscopy. We found that the conductance of the bundled SWCNTs was modulated by the applied radial force. The polarity and amount of the...

  • Atomic Force and Optical Microscopy Characterization of the Deformation of Individual Carbon Nanotubes and Nanofibers. Bigioni, Terry P.; Cruden, Brett A. // Journal of Nanomaterials;2008 Special Issue 1, p1 

    A popular technique for characterizing the mechanical properties of carbon nanotubes is to apply a one-dimension axial compression and measure its response to the compressive force. At some critical compression, a dramatic decrease in the force is observed. This has previously been attributed to...

  • Characterization of the electrical contact between a conductive atomic force microscope cantilever and a carbon nanotube. Ghanem, Tarek K.; Williams, Ellen D.; Fuhrer, Michael S. // Journal of Applied Physics;Sep2011, Vol. 110 Issue 5, p054305 

    A full characterization of the electrical contact between conductive atomic force microscope (AFM) cantilevers and carbon nanotubes (CNTs) is presented. The dependence of current through the contact on loading force, geometric parameters, bias conditions, and time is studied in a two-terminal...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics