A multilevel recording method of phase-change materials

Chaoyu Xiang; Lih-Hsin Chou
April 2010
Applied Physics Letters;4/26/2010, Vol. 96 Issue 17, p171105
Academic Journal
In this letter, a method of using ellipsometer parameters to analyze the phase-change material effects of polarized light is exhibited theoretically. The potential usage of polarized light on phase-change materials for information recording is demonstrated by calculating the polarized reflective light angle difference between amorphous and crystalline phases of Te doped GeSb9 films based on this exhibited theory from the ellipsometer data.


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