TITLE

MEMS-based high speed scanning probe microscopy

AUTHOR(S)
Disseldorp, E. C. M.; Tabak, F. C.; Katan, A. J.; Hesselberth, M. B. S.; Oosterkamp, T. H.; Frenken, J. W. M.; van Spengen, W. M.
PUB. DATE
April 2010
SOURCE
Review of Scientific Instruments;Apr2010, Vol. 81 Issue 4, p043702
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The high speed performance of a scanning probe microscope (SPM) is improved if a microelectromechanical systems (MEMS) device is employed for the out-of-plane scanning motion. We have carried out experiments with MEMS high-speed z-scanners (189 kHz fundamental resonance frequency) in both atomic force microscope and scanning tunneling microscope modes. The experiments show that with the current MEMS z-scanner, lateral tip speeds of 5 mm/s can be achieved with full feedback on surfaces with significant roughness. The improvement in scan speed, obtained with MEMS scanners, increases the possibilities for SPM observations of dynamic processes. Even higher speed MEMS scanners with fundamental resonance frequencies in excess of a megahertz are currently under development.
ACCESSION #
50173721

 

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