High Voltage-Cylinder Sector Analyzer 300/15: A cylindrical sector analyzer for electron kinetic energies up to 15 keV

Rubio-Zuazo, J.; Escher, M.; Merkel, M.; Castro, G. R.
April 2010
Review of Scientific Instruments;Apr2010, Vol. 81 Issue 4, p043304
Academic Journal
We have developed an energy analyzer, High Voltage-Cylinder Sector Analyzer 300/15, for electron kinetic energies up to 15 keV. It is especially suited for hard x-ray photoelectron spectroscopy, but also for ultraviolet and soft x-ray photoelectron spectroscopy (ultraviolet photoemission spectroscopy, x-ray photoemission spectroscopy), Auger electron spectroscopy, and reflection high energy electron spectroscopy. The analyzer is based on a cylinder sector with 90° deflection, 300 mm slit-to-slit distance, and a four-element pre-retarding lens system with 50 mm sample-to-lens distance. The result is a very compact design of the analyzer that is easily integrated into a multipurpose experiment with different techniques. A low noise/low drift electronics is capable of continuous energy scans from 0 to 15 keV using nonlinear lens curves. The first analyzer is allocated at the Spanish CRG SpLine beamline at the ESRF at an end station where simultaneous surface x-ray diffraction is possible. The analyzer is operated routinely since 2006 up to 15 keV electron kinetic energy, expanding the achievable electron kinetic energy range compared to other commercial analyzers. In this work we present a detailed description of the developed electron analyzer. The analyzer capabilities, in terms of energy resolution and transmission, are shown by using an electron gun, an ultraviolet-discharge lamp, and hard x-ray synchrotron radiation as excitation sources.


Related Articles

  • Hard X-ray Photoemission Spectroscopy using Excitation Energies of up to 10 keV for Materials Science. Kim, J. J.; Ikenaga, E.; Kobata, M.; Yabashi, M.; Kobayashi, K.; Nishino, Y.; Miwa, D.; Tamasaku, K.; Ishikawa, T. // AIP Conference Proceedings;2007, Vol. 879 Issue 1, p1407 

    Hard X-ray photoemission spectroscopy has been shown to be a powerful tool for investigating the bulk sensitive chemical and electronic states of solid materials. High energy resolution and high throughput have been achieved using the highly brilliant undulator X-rays available at SPring-8 along...

  • Non-destructive depth profile analysis using synchrotron radiation excited XPS. Zier, Michael; Oswald, Steffen; Reiche, Rainer; Wetzig, Klaus // Microchimica Acta;Dec2006, Vol. 156 Issue 1/2, p99 

    We have used synchrotron radiation as excitation source in an X-ray photoelectron spectroscopy (XPS) experiment to analyse surface-near element depth profiles non-dectructively. By tuning the photon energy one can vary the kinetic energy of the photoelectrons and in turn the information depth of...

  • Preparation and characterization of nitrogen-doped TiO2 photocatalyst in different acid environments. Ye Cong; Ling Xiao; Jinlong Zhang; Feng Chen; Anpo, Masakazu // Research on Chemical Intermediates;2006, Vol. 32 Issue 8, p717 

    Nitrogen-doped TiO2 powders were successfully prepared by a wet method, i.e., a micro-emulsion-hydrothermal method, in different acid environments. Several characterization techniques, X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and UV-visible diffuse reflectance spectra,...

  • Electronic properties of LiMn2- xTi xO4. Jie Song; Bing-Lin Hong; Jun Zheng; Pei Lin; Ming-Sen Zheng; Qi-Hui Wu; Quan-Feng Dong; Shi-Gang Sun // Applied Physics A: Materials Science & Processing;Feb2010, Vol. 98 Issue 2, p455 

    Ti-substituted LiMn2O4 (LiMn2- xTi xO4, x=0, 0.15, 0.30, 0.45, 0.60, and 0.75) has been synthesized using solid-state reactions. Their crystal and electronic structures were investigated using X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and ultraviolet photoelectron...

  • Preparation of N-doped TiO2 by oxidizing TiN and its application on phenol degradation. Ji-Guo Huang; Xiao-Guang Zhao; Meng-Yang Zheng; Sen Li; Yu Wang; Xing-Juan Liu // Water Science & Technology;2013, Vol. 68 Issue 4, p934 

    Incomplete oxidation of titanium nitride (TiN) to prepare nitrogen-doped TiO2 was verified by calcining TiN at different temperatures in air for 30 min. The as-prepared samples were characterized by X-ray diffraction, UV-Vis diffuse reflectance spectra and X-ray photoelectron spectroscopy. The...

  • Corrosion of Ga-doped Sn-0.7Cu Solder in Simulated Marine Atmosphere. Yan, Zhong; Xian, Ai-Ping // Metallurgical & Materials Transactions. Part A;Mar2013, Vol. 44 Issue 3, p1462 

    The surface corrosion behaviors of Sn and Sn-0.7Cu solder in simulated marine atmosphere have been studied. The results showed that pitting and uniform corrosion are the two main initial damage types in the corrosion process. During uniform corrosion, the initial corrosion products, which...

  • Effects of thermal annealing on the electrical and structural properties of Pt/Mo Schottky contacts on n-type GaN. Reddy, Varra Rajagopal; Ravinandan, M.; Rao, P. Koteswara; Chel-Jong Choi // Journal of Materials Science: Materials in Electronics;Oct2009, Vol. 20 Issue 10, p1018 

    Thermal annealing temperature effects on the electrical and structural properties of platinum/molybdenum (Pt/Mo) Schottky contacts on n-type GaN have been investigated by current–voltage (I–V), capacitance–voltage (C–V), X-ray diffraction (XRD), and X-ray...

  • Stability and deactivation research of RuO2-PdO/Ti electrode in dye water degradation. Lin Du; Jin Wu; Guiying Li; Changwei Hu // Water Science & Technology;2014, Vol. 70 Issue 5, p757 

    RuO2-PdO/Ti electrode was prepared and used for the electro-catalytic degradation of Active Red K-2BP. It was found that the electrode was very stable in the process. A discoloration rate of 96.2% could still be achieved on the electrode after being used for 100 runs. X-ray photoelectron...

  • Propiedades de las Peliculas de TiN/TiC Crecidas por la Técnica de Arco Pulsado. Devia-Narvaez, Diana M.; Duque Sanchez, Harold; Devia Narvaez, Diego F. // Scientia et Technica;abr2013, Vol. 18 Issue 1, p280 

    The TiN/TiC bilayers have been deposited by Plasma Assisted Physical Vapor Deposition Technique (PAPVD) - Reactive Pulsed Arc. The coatings were analyzed by X-Ray Photoelectron Spectroscopy (XPS) and X-Ray Diffraction (XRD). From the signal treatment of the narrow XPS spectra and the XRD...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics