TITLE

Ultrathin PtSi layers patterned by scanned probe lithography

AUTHOR(S)
Snow, E. S.; Campbell, P. M.; Twigg, M.; Perkins, F. K.
PUB. DATE
August 2001
SOURCE
Applied Physics Letters;8/20/2001, Vol. 79 Issue 8, p1109
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A process for patterning ultrathin layers of PtSi with high spatial resolution is presented. In this process, scanned probe anodic oxidation is used to pattern a surface oxide layer on a H-passivated Si surface. This oxide pattern prevents the reaction of a deposited Pt film with the underlying Si in the formation of PtSi. The unreacted Pt on the oxide is removed by a selective etch before any annealing. This process greatly reduces lateral diffusion and produces a 2-nm-thick PtSi layer with good electrical properties that maintains the fidelity of the patterned oxide mask. Such nanostructured PtSi films are a good candidate for use in constructing lateral Si-based quantum devices. © 2001 American Institute of Physics.
ACCESSION #
5017220

 

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