TITLE

Reliability and current carrying capacity of carbon nanotubes

AUTHOR(S)
Wei, B. Q.; Vajtai, R.; Ajayan, P. M.
PUB. DATE
August 2001
SOURCE
Applied Physics Letters;8/20/2001, Vol. 79 Issue 8, p1172
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The current-carrying capacity and reliability studies of multiwalled carbon nanotubes under high current densities (>10[sup 9] A/cm[sup 2]) show that no observable failure in the nanotube structure and no measurable change in the resistance are detected at temperatures up to 250 °C and for time scales up to 2 weeks. Our results suggest that nanotubes are potential candidates as interconnects in future large-scale integrated nanoelectronic devices. © 2001 American Institute of Physics.
ACCESSION #
5017199

 

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