Characterization of polycrystals with elongated duplex microstructure by inversion of ultrasonic backscattering data

Lobkis, O. I.; Rokhlin, S. I.
April 2010
Applied Physics Letters;4/19/2010, Vol. 96 Issue 16, p161905
Academic Journal
In this letter a simple analytical ultrasonic backscattering model is proposed for determination of characteristic microstructural scales in polycrystalline materials with elongated grains. The inversion methodology for microstructural parameters is based on backscattering coefficient ratios measured in different propagation directions. The ultrasonic backscattering measurements were performed on a Ti alloy sample with a duplex microstructure and the model was applied to experimental data inversion to size the material microtexture.


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