Enhancement of dielectric constant and associated coupling of polarization behavior in thin film relaxor superlattices

Corbett, M. H.; Bowman, R. M.; Gregg, J. M.; Foord, D. T.
August 2001
Applied Physics Letters;8/6/2001, Vol. 79 Issue 6
Academic Journal
Thin film capacitor structures in which the dielectric is composed of superlattices of the relaxors [0.2Pb(Zn[sub 1/3]Nb[sub 2/3])O[sub 3]–0.8BaTiO[sub 3]] and Pb(Mg[sub 1/3]Nb[sub 2/3])O[sub 3] have been fabricated by pulsed laser deposition. Superlattice wavelength (Λ) was varied between ∼3 and ∼600 nm, and dielectric properties were investigated as a function of Λ. Progressive enhancement of the dielectric constant was observed on decreasing Λ, and, in contrast to previous work, this was not associated with the onset of Maxwell–Wagner behavior. Polarization measurements as a function of temperature suggested that the observed enhancement in dielectric constant was associated with the onset of a coupled response. The superlattice wavelength (Λ=20 nm) at which coupled functional behavior became apparent is comparable to that found in literature for the onset of coupled structural behavior (between Λ=5 nm and Λ=10 nm). © 2001 American Institute of Physics.


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