Edge-enhanced imaging obtained with very broad energy band x-rays

Taibi, A.; Cardarelli, P.; Di Domenico, G.; Marziani, M.; Gambaccini, M.; Hanashima, T.; Yamada, H.
April 2010
Applied Physics Letters;4/5/2010, Vol. 96 Issue 14, p144102
Academic Journal
We demonstrate both theoretically and experimentally that edge-enhancement effects are produced when objects, in contact with the x-ray detector, are imaged by using very broad x-ray spectra. Radiographs of thin Al objects have been obtained with a table-top synchrotron source which generates x-rays in the energy range from a few kilo-electron-volts up to 6 MeV. Edge-enhancement effects arise from the combination of x-ray absorption (kilo-electron-volt part of the spectrum) and secondary particle emission (mega-electron-volt part of the spectrum) within the sample. The exact contribution of absorption and emission profiles in the edge-enhanced images has been calculated via Monte Carlo simulation.


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