Microwave determination of electron-hole recombination dynamics from spontaneous to stimulated emission in a quantum-well microcavity laser

Wu, C. H.; Then, H. W.; Feng, M.; Holonyak, N.
March 2010
Applied Physics Letters;3/29/2010, Vol. 96 Issue 13, p131108
Academic Journal
By studying the optical microwave frequency response of a microcavity quantum-well vertical cavity surface-emitting laser (VCSEL) in the transition, over a low (a spread-out) mode density, from spontaneous to coherent operation, we resolve the dynamics (spontaneous to stimulated) of electron-hole recombination and reveal the existence of “fast” spontaneous recombination (τBspon<159 ps) in a carrier population generally characterized by a large average lifetime of ∼1 ns (Δn/τav=Δn1/τfast+(Δn-Δn1)/τslow,τfast<τslow). The measured average spontaneous lifetime is not a constant but is altered by the device size, geometry, and boundary conditions (e. g., cavity and current input-output boundary conditions).


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