A sensitive near-field microscope for thermal radiation

Kajihara, Yusuke; Kosaka, Keishi; Komiyama, Susumu
March 2010
Review of Scientific Instruments;Mar2010, Vol. 81 Issue 3, p033706
Academic Journal
A scattering-type scanning near-field optical microscope in long-wavelength infrared (LWIR) region is developed by using an extremely sensitive detector, called the charge-sensitive infrared phototransistor. A tungsten probe attached to a quartz tuning fork is controlled in shear-force mode. Evanescent wave at a sample surface is periodically scattered by slowly (2 Hz) modulating the probe in the direction normal to the sample surface. Near-field microscopy of thermal LWIR radiation from room-temperature Au/GaAs gratings is demonstrated without using any external illumination or excitation. Achieved spatial resolution is better than 300 nm.


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