Electrical and mechanical coupling nanodamage in single ZnO nanobelts

Ya Yang; Junjie Qi; Yousong Gu; Wen Guo; Yue Zhang
March 2010
Applied Physics Letters;3/22/2010, Vol. 96 Issue 12, p123103
Academic Journal
The electrical and mechanical coupling nanodamage in single ZnO nanobelts has been investigated by using a conductive atomic force microscope. The measured damage threshold voltage was found to decrease from 12 to 6 V as the loading forces were changed from 20 to 180 nN. The mechanism of the decrease in the damage threshold voltages is suggested to be attributed to the strain induced change in electric structures in ZnO.


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