Luminescence efficiency measurements of silicon nanoclusters

Kenyon, A. J.; Trwoga, P. F.; Pitt, C. W.; Rehm, G.
July 1998
Applied Physics Letters;7/27/1998, Vol. 73 Issue 4
Academic Journal
We present the results of what we believe to be the first study of the power efficiency of room temperature photoluminescence from thin films of silica containing silicon nanoclusters. Films were prepared by plasma enhanced chemical vapor deposition from silane and nitrous oxide precursors. Luminescence was excited using the 476 nm line of an argon-ion laser. We have measured power efficiencies for samples that exhibit luminescence solely due to radiative recombination of quantum confined excitons. Efficiencies around 0.04% are reported. © 1998 American Institute of Physics.


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