TITLE

Built-In Self-Test Streamlines Testing Of Mixed-Signal SoCs

AUTHOR(S)
Turino, Jon
PUB. DATE
July 2001
SOURCE
Electronic Design;7/9/2001, Vol. 49 Issue 14, p67
SOURCE TYPE
Trade Publication
DOC. TYPE
Article
ABSTRACT
Reports test developments in the integration of digital and analog circuits in electronic designs. Complexities in testing mixed-signal functions; Presentation of built-in self-test methodologies; Capabilities of the methods.
ACCESSION #
4871354

 

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