Built-In Self-Test Streamlines Testing Of Mixed-Signal SoCs

Turino, Jon
July 2001
Electronic Design;7/9/2001, Vol. 49 Issue 14, p67
Trade Publication
Reports test developments in the integration of digital and analog circuits in electronic designs. Complexities in testing mixed-signal functions; Presentation of built-in self-test methodologies; Capabilities of the methods.


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