TITLE

Real-time atomic force microscopy imaging of photoinduced surface deformation in AsxSe100-x chalcogenide films

AUTHOR(S)
Trunov, M. L.; Lytvyn, P. M.; Nagy, P. M.; Dyachyns'ka, O. M.
PUB. DATE
March 2010
SOURCE
Applied Physics Letters;3/15/2010, Vol. 96 Issue 11, p111908
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We present direct measurements of the kinetics of surface relief gratings (SRGs) formation in amorphous AsxSe100-x (20≤xAs≤50) thin films. SRGs are induced in different holographic schemes of recording using near-band-gap light and their growth is further facilitated by illumination with an interference pattern and observed in real time by in situ atomic force microscopy. It is found that the kinetics of SRG formation depends upon film composition and incident light polarization. The light-stimulated vectorial surface deformations are maximized for Se-rich glasses and increase even further by additional illumination during recording.
ACCESSION #
48698078

 

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