Electrical and pyroelectric properties of in-plane polarized lead lanthanum titanate thin film

Song, Z. T.; Chong, N.; Chan, H. L. W.; Choy, C. L.
July 2001
Applied Physics Letters;7/30/2001, Vol. 79 Issue 5
Academic Journal
Pb[sub 0.9]La[sub 0.1]Ti[sub 0.975]O[sub 3] (PLT10) thin films were deposited on SiO[sub 2]/Si(100) substrates coated with a ZrO[sub 2] buffer layer. Studies by x-ray diffraction and scanning electron microscopy reveal that the ZrO[sub 2] film consists of both tetragonal and monoclinic phases, with the tetragonal phase being the dominant one. The PLT10 film has a perovskite structure and the grains in the film have a rather uniform size of about 50 nm. By using interdigital transducer (IDT) electrodes the in-plane electrical properties, hysteresis loop, and pyroelectric coefficient of the PLT10 film were measured. The dielectric constant and loss factor vary only slightly with frequency in the range 10[sup 3]–10[sup 6] Hz, with the loss factor being less than 0.01 over the entire range. The leakage current density is lower than 2×10[sup -8] A/cm[sup 2] at a bias field of 5 kV/cm. The remnant polarization and coercive field are 12.6 μC/cm[sup 2] and 9.93 kV/cm, respectively. The film exhibits a reasonably high pyroelectric coefficient (95 μC/m[sup 2] K) after it has been poled by applying 120 V ac at 0.1 Hz across the IDT electrodes. © 2001 American Institute of Physics.


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