Strain relaxation in epitaxial (Pb,Sr)TiO3 thin films on NdGaO3 substrates

Lin, Y.; Dai, C.; Li, Y. R.; Chen, X.; Chen, C. L.; Bhalla, A.; Jia, Q. X.
March 2010
Applied Physics Letters;3/8/2010, Vol. 96 Issue 10, p102901
Academic Journal
Strain relaxation behavior of (Pb,Sr)TiO3 thin films on (110) NdGaO3 substrates fabricated under different conditions have been investigated using high resolution x-ray diffraction. Dislocation densities and interfacial strain distribution have been systematically studied with samples in different postdeposition cooling rates. Strain relaxation and dislocation evolution are found to be dependent upon the cooling process. The relationship of dielectric properties and the strain and dislocations of the films were discussed.


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