TITLE

Hard x-ray nanobeam characterization by coherent diffraction microscopy

AUTHOR(S)
Schropp, A.; Boye, P.; Feldkamp, J. M.; Hoppe, R.; Patommel, J.; Samberg, D.; Stephan, S.; Giewekemeyer, K.; Wilke, R. N.; Salditt, T.; Gulden, J.; Mancuso, A. P.; Vartanyants, I. A.; Weckert, E.; Schöder, S.; Burghammer, M.; Schroer, C. G.
PUB. DATE
March 2010
SOURCE
Applied Physics Letters;3/1/2010, Vol. 96 Issue 9, p091102
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We have carried out a ptychographic scanning coherent diffraction imaging experiment on a test object in order to characterize the hard x-ray nanobeam in a scanning x-ray microscope. In addition to a high resolution image of the test object, a detailed quantitative picture of the complex wave field in the nanofocus is obtained with high spatial resolution and dynamic range. Both are the result of high statistics due to the large number of diffraction patterns. The method yields a complete description of the focus, is robust against inaccuracies in sample positioning, and requires no particular shape or prior knowledge of the test object.
ACCESSION #
48429024

 

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