TITLE

Electron beam induced current investigations of Pt/SrTiO3-x interface exposed to chemical and electrical stresses

AUTHOR(S)
Jiang, W.; Evans, D.; Bain, J. A.; Skowronski, M.; Salvador, P. A.
PUB. DATE
March 2010
SOURCE
Applied Physics Letters;3/1/2010, Vol. 96 Issue 9, p092102
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Pt Schottky contacts were fabricated on oxygen deficient SrTiO3-x [001] single crystals. Electron beam induced current (EBIC) and atomic force microscopy images taken on etched SrTiO3 (001) surfaces revealed that the dark {001} oriented lines observed in EBIC correlate with arrays of dislocation etch pits. Annealing contacts in air (at 120 °C for 10 min) changed the dislocation-related EBIC contrast from dark to bright. Electrically stressing the air-annealed Schottky contacts at -10 V for 1 h caused the dislocation-related EBIC contrast to return to dark. The contrast changes are interpreted as arising from oxygen vacancy motion in response to chemical or electrical stresses.
ACCESSION #
48429022

 

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