Mesostructural origin of stress-induced magnetic anisotropy in Fe-based nanocrystalline ribbons

Fang, Y. Z.; Zheng, J. J.; Wu, F. M.; Xu, Q. M.; Zhang, J. Q.; Ye, H. Q.; Zheng, J. L.; Li, T. Y.
March 2010
Applied Physics Letters;3/1/2010, Vol. 96 Issue 9, p092508
Academic Journal
The cross-sectional mesostructure of a stress-annealed Fe-based (Fe73.5Cu1Nb3Si13.5B9) ribbon (SAR) has been investigated by atomic force microscopy. The magnetic anisotropy field was measured via the curves of the giant magnetoimpedence effect in SAR. The stress-induced magnetic anisotropy field (ΔHk) showed a linear correlation with the transverse congregating vector Kv of the agglomerated grains. This indicated that the ΔHk originated from the directional congregation of the agglomerated grains formed in SAR. A model for this directional congregation has been established. The previous diverse viewpoints on the mechanism of stress-induced magnetic anisotropy have been unified in this model.


Related Articles

  • Origin of giant polarization splitting in high quality organic microcavities. Stelitano, S.; Savasta, S.; Patané, S.; De Luca, G.; Monsù Scolaro, L. // Journal of Applied Physics;Aug2009, Vol. 106 Issue 3, p033102 

    We study the emission properties of a high quality monolithic microcavity with an embedded ultrathin organic tetrakis(4-methoxyphenyl)porphyrin layer. Spectral and angle-resolved photoluminescence measurements show a well defined polarized doublet at detection angles larger than 15°. The...

  • A Rotating-Tip-Based Mechanical Nano-Manufacturing Process: Nanomilling. Gozen, B.; Ozdoganlar, O. // Nanoscale Research Letters;Sep2010, Vol. 5 Issue 9, p1403 

    We present a rotating-tip-based mechanical nanomanufacturing technique, referred to here as nanomilling. An atomic force microscopy (AFM) probe tip that is rotated at high speeds by out-of-phase motions of the axes of a three-axis piezoelectric actuator is used as the nanotool. By circumventing...

  • Conduction mechanisms and charge storage in Si-nanocrystals metal-oxide-semiconductor memory devices studied with conducting atomic force microscopy. Porti, M.; Avidano, M.; Nafría, M.; Aymerich, X.; Carreras, J.; Garrido, B. // Journal of Applied Physics;9/1/2005, Vol. 98 Issue 5, p056101 

    In this work, we demonstrate that conductive atomic force microscopy (C-AFM) is a very powerful tool to investigate, at the nanoscale, metal-oxide-semiconductor structures with silicon nanocrystals (Si-nc) embedded in the gate oxide as memory devices. The high lateral resolution of this...

  • Nanolocalized charge writing in thin SiO2 layers with embedded silicon nanocrystals under an atomic force microscope probe. Dunaevskii, M. S.; Titkov, A. N.; Larkin, S. Yu.; Speshilova, A. B.; Aleksandrov, S. E.; Bonafos, C.; Claverie, A.; Laiho, R. // Technical Physics Letters;Oct2007, Vol. 33 Issue 10, p889 

    The possibility of temporally stable nanolocalized charging of thin SiO2 layers with embedded silicon nanocrystals (nc-Si) is demonstrated. The local charge writing and reading in SiO2 layers were performed using the electrostatic force microscopy (EFM) technique under the probe of an atomic...

  • Step-induced uniaxial magnetic anisotropy of La0:67Sr0:33MnO3 thin films. Mathews, Mercy; Postma, Ferry M.; Lodder, J. Cock; Jansen, R.; Rijnders, Guus; Blank, Dave H. A. // Applied Physics Letters;12/12/2005, Vol. 87 Issue 24, p242507 

    The magnetic anisotropy of epitaxial La0.67Sr0.33MnO3 (LSMO) thin films on vicinal, TiO2-terminated SrTiO3 substrates is investigated. Atomic force microscopy shows a regular step-terrace structure on the LSMO surface which is a replication of the surface of the substrate. The films show...

  • Capturing and depositing one nanoobject at a time: Single particle dip-pen nanolithography. Wang, Ying; Zhang, Yi; Li, Bin; Lü, Junhong; Hu, Jun // Applied Physics Letters;3/26/2007, Vol. 90 Issue 13, p133102 

    A convenient technique for transferring nanoparticles in a one-particle-at-a-time fashion is presented. This technique, termed as single particle dip-pen nanolithography, employs an atomic force microscope (AFM) tip to “grab” individual gold nanoparticles on surfaces. The...

  • Intense pulsed light sintering of copper nanoink for printed electronics. Hak-Sung Kim; Dhage, Sanjay R.; Dong-Eun Shim; Hahn, H. Thomas // Applied Physics A: Materials Science & Processing;Dec2009, Vol. 97 Issue 4, p791 

    An intense pulsed light (IPL) from a xenon flash lamp was used to sinter copper nanoink printed on low-temperature polymer substrates at room temperature in ambient condition. The IPL can sinter the copper nanoink without damaging the polymer substrates in extremely short time (2 ms). The...

  • High speed atomic force microscope lithography driven by electrostatic interaction. Ding, Lei; Li, Yan; Chu, Haibin; Li, Changqing; Yang, Zhaohui; Zhou, Weiwei; Tang, Zi Kang // Applied Physics Letters;7/9/2007, Vol. 91 Issue 2, p023121 

    This letter paper describes a scanning probe lithography method for fabricating patterns of various nanoparticles on SiOx/Si substrate. The electrostatic interaction resulting from the charge separation caused by the friction between the atomic force microscope (AFM) tip and the substrate was...

  • Time-resolved chloroquine-induced relaxation of supercoiled plasmid DNA. Mahut, Marek; Leitner, Michael; Ebner, Andreas; Lämmerhofer, Michael; Hinterdorfer, Peter; Lindner, Wolfgang // Analytical & Bioanalytical Chemistry;Feb2012, Vol. 402 Issue 1, p373 

    Herein, we report on the in vitro change of DNA conformation of plasmids bound to a 3-aminopropyl-modified mica surface and monitoring the events by atomic force microscopy (AFM) imaging under near physiological conditions. In our study, we used an intercalating drug, chloroquine, which is known...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics