Status report of the Dresden EBIS/EBIT developments

Zschornack, G.; Grossmann, F.; Kentsch, U.; Ovsyannikov, V. P.; Ritter, E.; Schmidt, M.; Thorn, A.; Ullmann, F.
February 2010
Review of Scientific Instruments;Feb2010, Vol. 81 Issue 2, p02A512
Academic Journal
We give an overview about latest developments and measurements with the Dresden electron beam ion source family as compact and economically working table-top sources of highly charged ions. The ion sources are potential tools for various applications such as for use in combination with accelerators in medical particle therapy, as charge breeder or ion trap injector, as ion sources for a new generation of focused ion beam devices and for applications together with time-of-flight secondary mass spectrometers.


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