Electron beam ion source and electron beam ion trap (invited)

Becker, Reinard; Kester, Oliver
February 2010
Review of Scientific Instruments;Feb2010, Vol. 81 Issue 2, p02A513
Academic Journal
The electron beam ion source (EBIS) and its trap variant [electron beam ion trap (EBIT)] celebrated their 40th and 20th anniversary, respectively, at the EBIS/T Symposium 2007 in Heidelberg. These technologically challenging sources of highly charged ions have seen a broad development in many countries over the last decades. In contrast to most other ion sources the recipe of improvement was not “sorcery” but a clear understanding of the physical laws and obeying the technological constraints. This review will report important achievements of the past as well as promising developments in the future.


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