TITLE

Determination of the dispersion of the index of refraction and the elastic moduli for molecular-beam-epitaxy-grown Zn[sub 1-x]Be[sub x]Se alloys

AUTHOR(S)
Peiris, F. C.; Bindley, U.; Furdyna, J. K.; Kim, Hyunjung; Ramdas, A. K.; Grimsditch, M.
PUB. DATE
July 2001
SOURCE
Applied Physics Letters;7/23/2001, Vol. 79 Issue 4
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The prism coupler technique, together with reflectivity channeled spectra, were used to determine the dispersion of the indices of refraction for a series of ternary alloys of Zn[sub 1-x]Be[sub x]Se grown by molecular-beam epitaxy on GaAs substrates. The measurements covered the wavelength range of 400–1300 nm, and the entire Be concentration range, from x=0 to 1.00. The availability of accurate values of the index-of-refraction then enabled us to determine the elastic moduli c[sub 11] for the Zn[sub 1-x]Be[sub x]Se and its dependence on the Be concentration x from frequency shifts in Brillouin scattering spectra observed on the epilayers of these ternary alloys. The c[sub 11] results clearly indicate that the bonding in Zn[sub 1-x]Be[sub x]Se becomes more robust as the Be concentration increases. © 2001 American Institute of Physics.
ACCESSION #
4826003

 

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