Atomic-scale observation of polarization switching in epitaxial ferroelectric thin films

Marasco, D. L.; Kazimirov, A.; Bedzyk, M. J.; Lee, T.-L.; Streiffer, S. K.; Auciello, O.; Bai, G.-R.
July 2001
Applied Physics Letters;7/23/2001, Vol. 79 Issue 4
Academic Journal
The thin-film x-ray standing wave (XSW) technique is used for an atomic-scale study of polarization switching in ferroelectric Pb(Zr[sub 0.3]Ti[sub 0.7])O[sub 3] (PZT)/electrode heterostructures grown on SrTiO[sub 3](001). The XSW is selectively generated in the PZT by the interference between the incident x-ray wave and the weak (001) Bragg diffracted wave from the film. The XSW excites a fluorescence signal from the Pb ions in the PZT film, that is used to determine their subangstro¨m displacements after polarization switching has occurred. This experimental method yields unique information on the underlying atomic configurations for different polarization domain states. © 2001 American Institute of Physics.


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